NGOC, D. T. B. Automated Test Data Generation for Embedded System Models Using Combinatorial Testing. Journal of Science and Technology on Information security, [S. l.], v. 3, n. 17, p. 78-84, 2023. DOI: 10.54654/isj.v3i17.890. Disponível em: https://isj.vn/index.php/journal_STIS/article/view/890. Acesso em: 9 jun. 2023.