LINH, H. Đình. Some results on new statistical randomness tests based on length of runs. Journal of Science and Technology on Information security, [S. l.], v. 8, n. 2, p. 10-18, 2020. DOI: 10.54654/isj.v8i2.28. Disponível em: https://isj.vn/index.php/journal_STIS/article/view/28. Acesso em: 9 jun. 2023.