LINH, H. D.; CHI, D. D. .; ANH, N. T. .; UYEN, L. T. . On the correlation and sensitivity of so far statistical randomness tests based on runs. Journal of Science and Technology on Information security, [S. l.], v. 2, n. 14, p. 55-65, 2022. DOI: 10.54654/isj.v2i14.212. Disponível em: https://isj.vn/index.php/journal_STIS/article/view/212. Acesso em: 4 jul. 2022.